Incident angle variable from 30° to 85°.
Accommodates samples larger than 12mm x 12mm, up to 12mm thick.
Maintains alignment for all incident angles.
Optional Reflectance Reference for mid-infrared absolute reflectance measurements.
Adaptable for variable angle, fixed angle, and absolute specular reflection studies.
Optional sample stages for absolute specular reflectance and horizontal sampling.
Models available for a wide range of FT-IR spectrometers and UV-Vis spectrometers.
Optical base unit with variable angle specular reflectance sample stage.
Mating hardware for the specified UV-Vis or FT-IR spectrometer.